2004 CHRYSLER PT CRUISER — Complaint #495242
Open-data reference.
NHTSA Complaint about CHILD SEAT:BASE filed September 9, 2004
NHTSA complaint #495242 (ODI reference 10091723) concerns a 2004 CHRYSLER PT CRUISER and was filed on September 9, 2004. The owner reports the failure occurred on September 9, 2004. The report was geocoded to Missouri based on the filer's self-reported location. The affected component is categorized as child seat:base, one of NHTSA's standardized taxonomy codes used to group defect patterns across make, model, and year.
The filer flagged the following severity indicators: crash: no, fire: no, injuries: 0, fatalities: 0. No crash, fire, or fatality was associated with this report, which places it in the early-warning stream rather than the priority-review stream. No VIN was supplied by the filer, so this complaint contributes to model-year trend data but cannot be tied to a specific vehicle.
Individual complaints are consumer-submitted and unverified by NHTSA engineers — the agency's role at this stage is to collect, index, and make them searchable. What matters for federal action is the pattern: when many owners of the same CHRYSLER PT CRUISER cohort independently describe similar child seat:base failures, defect investigators have grounds to open a PE and request manufacturer data. Related filings for the same vehicle and component appear below, and the detail page for the full 2004 CHRYSLER PT CRUISER shows the complete component-level complaint distribution alongside any active investigations or recalls.
Complaint Description
EVENFLO, MODEL # 3861364P1, DOM 06/13/2003. WHILE TAKING THE CHILD OUT OF THE CAR SEAT OFF THE BASE DID NOT DETACH. CONSUMER TRIED TO PULL IT APART AND IT DID NOT MOVE. CONSUMER CONTACTED THE DEALER. *AK
Complaint Details
| NHTSA Complaint ID | 495242 |
| ODI Number | 10091723 |
| Date Filed | September 9, 2004 |
| Failure Date | September 9, 2004 |
Source: NHTSA Vehicle Complaints Database. Component taxonomy and severity codes are standardized by NHTSA Office of Defects Investigation.
Read our methodology — how this data is sourced, computed, and verified.